Custom Structural Analysis Comparing the Toshiba 56nm 8Gb and 16Gb MLC NAND Flash Devices (Engineering Sample)

This report provides package images, package XRay and die images and markings. SEM cross sectional image in the bitline direction through the array to determine lithography generation are also provided. This analysis, when combined with the Toshiba 56nm 8Gb Flash detailed structural analysis, provides enough information to assess key similarities and differences between the 16Gb and 8Gb devices.