Internal Waveform Analysis of the Page Buffer Related Signals on the Samsung K9GAG08U0D 42nm 16Gbit MLC NAND Flash

The probing analysis on the Samsung K9GAG08U0D 42nm 16Gbit MLC NAND Flash will provide details of the internal voltages required on Page Buffer related signals during program operation. The probing analysis tests the flash in an active probe arrangement and voltage traces of the signals are recorded during program state 00 only.
This report contains:


1) Waveforms of the selected Wordline (GWL), Bitline (BL), and Page Buffer Control signals (PB_CT1 & PB_CT8) for programming state 00.
2) Waveforms of the selected Wordline (GWL), Bitline (BL), Page Buffer Control signal (PB_CT1), and Bitline Pre-Charge Enable (~BL_PU) for programming state 00