Process Quick Look of the Micron (IMFT) MT29F32G08 34nm 32Gbit MLC NAND Flash

This report provides a technical snapshot of the device. The report contains an extended device summary table, which includes information on lithography generation, feature size, minimum observed transistor gate length, metallization, number of metal layers and die thickness; it also includes two SEM Cross-Sectional images along with photographs of the die and package.